雜志介紹

Journal Of Electronic Testing-theory And Applications雜志介紹

《Journal Of Electronic Testing-theory And Applications》是一本以English為主的未開放獲取國(guó)際優(yōu)秀期刊，中文名稱電子測(cè)試?yán)碚撆c應(yīng)用雜志，本刊主要出版、報(bào)道工程技術(shù)-ENGINEERING, ELECTRICAL & ELECTRONIC領(lǐng)域的研究動(dòng)態(tài)以及在該領(lǐng)域取得的各方面的經(jīng)驗(yàn)和科研成果，介紹該領(lǐng)域有關(guān)本專業(yè)的最新進(jìn)展，探討行業(yè)發(fā)展的思路和方法，以促進(jìn)學(xué)術(shù)信息交流，提高行業(yè)發(fā)展。該刊已被國(guó)際權(quán)威數(shù)據(jù)庫(kù)SCIE收錄，為該領(lǐng)域相關(guān)學(xué)科的發(fā)展起到了良好的推動(dòng)作用，也得到了本專業(yè)人員的廣泛認(rèn)可。該刊最新影響因子為1.1，最新CiteScore 指數(shù)為2。

本刊近期中國(guó)學(xué)者發(fā)表的論文主要有：

• A Layout-Based Rad-Hard DICE Flip-Flop Design

  Author: Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen

• A Semantics-based Translation Method for Automated Verification of SystemC TLM Designs

  Author: Yanyan Gao, Xi Li

• Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding

  Author: Tie-Bin Wu, Heng-Zhu Liu, Peng-Xia Liu

• An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis

  Author: Yongcai Ao, Yibing Shi, Wei Zhang, Yanjun Li

英文介紹

Journal Of Electronic Testing-theory And Applications雜志英文介紹

The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.

Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:

Testing of VLSI devices printed circuit boards, and electronic systems;

Testing of analog and digital electronic circuits;

Testing of microprocessors, memories, and signal processing devices;

Fault modeling;

Test generation;

Fault simulation;

Testability analysis;

Design for testability;

Synthesis for testability;

Built-in self-test;

Test specification;

Fault tolerance;

Formal verification of hardware;

Simulation for verification;

Design debugging;

AI methods and expert systems for test and diagnosis;

Automatic test equipment (ATE);

Test fixtures;

Electron Beam Test Systems;

Test programming;

Test data analysis;

Economics of testing;

Quality and reliability;

CAD Tools;

Testing of wafer-scale integration devices;

Testing of reliable systems;

Manufacturing yield and design for yield improvement;

Failure mode analysis and process improvement