雜志介紹

Microelectronics Reliability雜志介紹

《Microelectronics Reliability》是一本以English為主的未開放獲取國際優(yōu)秀期刊，中文名稱微電子可靠性，本刊主要出版、報道工程技術-ENGINEERING, ELECTRICAL & ELECTRONIC領域的研究動態(tài)以及在該領域取得的各方面的經(jīng)驗和科研成果，介紹該領域有關本專業(yè)的最新進展，探討行業(yè)發(fā)展的思路和方法，以促進學術信息交流，提高行業(yè)發(fā)展。該刊已被國際權威數(shù)據(jù)庫SCIE收錄，為該領域相關學科的發(fā)展起到了良好的推動作用，也得到了本專業(yè)人員的廣泛認可。該刊最新影響因子為1.6，最新CiteScore 指數(shù)為3.3。

本刊近期中國學者發(fā)表的論文主要有：

• Effect of Sb content on the phase structure and interface structure of Sn1.0Ag0.5Cu lead-free solder

  Author: Xu, Fengxian; Zhu, Wenjia; Yan, Jikang; Zhao, Lingyan; Lv, Jinmei

• Electrical characterization and temperature reliability of 4H-SiC Schottky barrier diodes after Electron radiation

  Author: Xiang, Meiju; Wang, Duowei; He, Mu; Rui, Guo; Ma, Yao; Zhu, Xuhao; Mei, Fan; Gong, Min; Li, Yun; Huang, Mingmin; Yang, Zhimei

• Small sample classification based on data enhancement and its application in flip chip defection

  Author: Sha, Yuhua; He, Zhenzhi; Gutierrez, Hector; Du, Jiawei; Yang, Weiwei; Lu, Xiangning

• BP neural network for non-invasive IGBT junction temperature online detection

  Author: Liu, Li; Peng, Qianlei; Jiang, Huaping; Ran, Li; Wang, Yang; Du, Changhong; Chen, Jian; Zhou, Hongbo; Chen, Yang; Peng, Zhiyuan

英文介紹

Microelectronics Reliability雜志英文介紹

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.

Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.